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1-1(73) 2012
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- V.I. Syryamkin, A.Zh. Kaztaev, D.S. Zhdanov, V.V. Brazovsky, G.S. Glushkov, S.I. Burmantov, S.O. Lunev, V.A. Borodin
Metrological Support for X-ray Computed Microtomography Systems
This article describes the basic principles of the developed X-ray computed tomography system and the current state of normative and legislative base of metrological support for X-ray computed micro tomography system.
Key words: metrological support, verification methods, X-ray computed micro tomography system, standardization.
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