Scientific journal "The News of Altai State University". 2012 #1-2(73). Physics.

Scientific journal of the
theoretical and applied
researches

Print ISSN 1561-9443
On-line ISSN 1561-9451

Issues list
	Content of 1-2(73) 2012
		Management, Computer Facilities and Computer Science
		Mathematics and Mechanics
		Physics

1-2(73)

2012

Previous | Next

A.N. Makrushina, S.V. Makarov, V.A. Plotnikov

Relaxation Processes in Thin Films of Copper and Tin

The study analyzes relaxation in Cu-Sn doublelayer and multilayer films. It is determined that the resistance depends on temperature in the multilayer film. An X-ray analysis of annealed and not annealed films revealed the formation of Cu₆Sn₅ compound. Sound microscope method detected formation of normalized substructure.

Key words: thin-film structures, structural relaxation, void volume, Arrhenius plot, electrical resistivity, intermetallide, substructure.

Full text at PDF, 608Kb. Language: russian.

Print Edition of "The News of Altai State University" copyright 1996-2012 Altai State University.
All rights reserved. Any of parts of a journal or edition as a whole cannot be reprinted without the written sanction of the authors or publisher. On purchase of a journal to address to ASU publishing house:
Altai State University. 656039, 66 Dimitrova street, Barnaul, Russia. Telephone + 7 (3852) 366351.